Built-In Self-Test

/bɪst/

n. "Self-contained test circuitry embedded within ICs generating PRBS patterns to validate SerDes and logic post-manufacturing."

Serializer/Deserializer

/ˈsɜːr dɛs/

n. "Parallel-to-serial transceiver pair enabling high-speed chip-to-chip communication over minimal pins."

Decision Feedback Equalizer

/ˌdiː ɛf ˈiː/

n. "Decision Feedback Equalizer slicing post-cursor ISI via nonlinear tapped delay line in high-speed SerDes receivers."

Device Under Test

/ˌdiː juː ˈtiː/

n. "Electronic component or system currently undergoing validation by BERT or oscilloscope against specifications."

Pseudorandom Binary Sequence

/piː ɑːr biː ɛs/

n. "Deterministic bitstream mimicking true randomness via linear feedback shift registers for high-speed link stress testing."

PMIC

/ˈpiː mɪk/

n. — "DDR5 DIMM's built-in power butler stabilizing noisy rails."